Gaya APA

Stephen, H, M, W, J, P, D, I, J. (2019). System-Independent Characterization of Materials Using Dual-Energy Computed Tomography (IEEE19) . : IEEE.

Gaya MLA

Stephen, Harry,, Maurice,, William,, Jeffrey,, Patrick,, Daniel,, Isaac,, Jerel. "System-Independent Characterization of Materials Using Dual-Energy Computed Tomography (IEEE19)". : IEEE, 2019. Text.